PFS - DNN Hardware Reliability Assessment and Enhancement
| dc.contributor.author | Taheri, Mahdi |
| dc.date.accessioned | 2022-07-12T09:20:45Z |
| dc.date.issued | 2022-05 |
| dc.description.abstract | Emergence of Deep Neural Networks (DNN) has led to a proliferation of artificial intelligence applications. Although applications of DNNs to real-world problems have become ubiquitous, there is a lack of understanding of how these circuits are affected by faults. Due to this fact, adoption of DNNs in safety-critical domain has been lagging behind. As there exist no commonly accepted reliability assessment metrics for DNNs, their certification for safety-critical applications is not possible. In this PhD thesis, we are optimising the fault injection process that is a widely used reliability assessment technique for DNNs. |
| dc.format.extent | 3 p. |
| dc.identifier.citation | Taheri, M. DNN Hardware Reliability Assessment and Enhancement. A: 27th IEEE European Test Symposium (ETS). 2022, |
| dc.identifier.uri | https://hdl.handle.net/2117/369987 |
| dc.language.iso | eng |
| dc.relation.publisherversion | https://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding |
| dc.rights.access | Restricted access - publisher's policy |
| dc.rights.licensename | Attribution-NonCommercial-NoDerivatives 4.0 International |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
| dc.subject.lcsh | Microelectronics |
| dc.subject.lcsh | Integrated circuits |
| dc.subject.lcsh | Spinitronics |
| dc.subject.lemac | Microelectrònica |
| dc.subject.lemac | Circuits integrats |
| dc.subject.lemac | Espintrònica |
| dc.subject.other | Reliability Assessment |
| dc.subject.other | Deep Neural Networks |
| dc.subject.other | DNN Hardware Accelerator |
| dc.subject.other | Fault Injection |
| dc.title | PFS - DNN Hardware Reliability Assessment and Enhancement |
| dc.type | Conference report |
| dspace.entity.type | Publication |
| local.citation.contributor | 27th IEEE European Test Symposium (ETS) |
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