A general analysis of the impact of digitization in microwave correlation radiometers

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dc.contributor.authorBosch Lluís, Xavier
dc.contributor.authorRamos Pérez, Isaac
dc.contributor.authorCamps Carmona, Adriano José
dc.contributor.authorRodríguez Álvarez, Nereida
dc.contributor.authorValencia Domènech, Enric
dc.contributor.authorHyuk, Park
dc.contributor.groupUniversitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2011-08-24T09:41:50Z
dc.date.available2011-08-24T09:41:50Z
dc.date.created2011-06
dc.date.issued2011-06
dc.description.abstractThis study provides a general framework to analyze the effects on correlation radiometers of a generic quantization scheme and sampling process. It reviews, unifies and expands several previous works that focused on these effects separately. In addition, it provides a general theoretical background that allows analyzing any digitization scheme including any number of quantization levels, irregular quantization steps, gain compression, clipping, jitter and skew effects of the sampling period.
dc.description.peerreviewedPeer Reviewed
dc.description.versionPostprint (published version)
dc.format.extent22 p.
dc.identifier.citationBosch, X. [et al.]. A general analysis of the impact of digitization in microwave correlation radiometers. "Sensors", Juny 2011, vol. 11, núm. 6, p. 6066-6087.
dc.identifier.doi10.3390/s110606066
dc.identifier.issn1424-8220
dc.identifier.urihttps://hdl.handle.net/2117/13101
dc.language.isoeng
dc.rights.accessOpen Access
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Processament del senyal::Processament del senyal en les telecomunicacions
dc.subject.lcshRadiometers -- Design and construction
dc.subject.lemacRadiòmetres -- Disseny
dc.titleA general analysis of the impact of digitization in microwave correlation radiometers
dc.typeArticle
dspace.entity.typePublication
local.citation.authorBosch, X.; Ramos, I.; Camps, A.; Rodriguez, N.; Valencia, E.; Hyuk, P.
local.citation.endingPage6087
local.citation.number6
local.citation.publicationNameSensors
local.citation.startingPage6066
local.citation.volume11
local.identifier.drac5837693

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