POS2 - Smart Redundancy Schemes for ANNs Against Fault Attacks
| dc.contributor.author | Köylü, Troya Çagıl |
| dc.contributor.author | Hamdioui, Said |
| dc.contributor.author | Taouil, Mottaqiallah |
| dc.date.accessioned | 2022-07-08T08:14:00Z |
| dc.date.issued | 2022-05 |
| dc.description.abstract | Artificial neural networks (ANNs) are used to accomplish a variety of tasks, including safety critical ones. Hence, it is important to protect them against faults that can influence decisions during operation. In this paper, we propose smart and low-cost redundancy schemes that protect the most vulnerable ANN parts against fault attacks. Experimental results show that the two proposed smart schemes perform similarly to dual modular redundancy (DMR) at a much lower cost, generally improve on the state of the art, and reach protection levels in the range of 93% to 99%. |
| dc.format.extent | 2 p. |
| dc.identifier.citation | Köylü, T.Ç.; Hamdioui, S.; Taouil, M. POS2 - Smart Redundancy Schemes for ANNs Against Fault Attacks. A: 27th IEEE European Test Symposium (ETS). 2022, |
| dc.identifier.uri | https://hdl.handle.net/2117/372123 |
| dc.language.iso | eng |
| dc.relation.publisherversion | https://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding |
| dc.rights.access | Restricted access - publisher's policy |
| dc.rights.licensename | Attribution-NonCommercial-NoDerivatives 4.0 International |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
| dc.subject.lcsh | Microelectronics |
| dc.subject.lcsh | Integrated circuits |
| dc.subject.lcsh | Spintronics |
| dc.subject.lemac | Microelectrònica |
| dc.subject.lemac | Circuits integrats |
| dc.subject.lemac | Espintrònica |
| dc.subject.other | Artificial neural network |
| dc.subject.other | Redundancy |
| dc.subject.other | Fault injection |
| dc.subject.other | Countermeasure |
| dc.subject.other | Machine learning |
| dc.title | POS2 - Smart Redundancy Schemes for ANNs Against Fault Attacks |
| dc.type | Conference report |
| dspace.entity.type | Publication |
| local.citation.contributor | 27th IEEE European Test Symposium (ETS) |
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