A Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs

dc.contributor.authorSalami, Behzad
dc.contributor.authorUnsal, Osman Sabri
dc.contributor.authorCristal Kestelman, Adrián
dc.contributor.otherBarcelona Supercomputing Center
dc.contributor.otherUniversitat Politècnica de Catalunya. Doctorat en Arquitectura de Computadors
dc.date.accessioned2019-03-26T10:10:26Z
dc.date.available2019-03-26T10:10:26Z
dc.date.issued2018-12-06
dc.description.abstractThe power consumption of digital circuits, e.g., Field Programmable Gate Arrays (FPGAs), is directly related to their operating supply voltages. On the other hand, usually, chip vendors introduce a conservative voltage guardband below the standard nominal level to ensure the correct functionality of the design in worst-case process and environmental scenarios. For instance, this voltage guardband is empirically measured to be 12%, 20%, and 16% of the nominal level in commercial CPUs [1], Graphics Processing Units (GPUs) [2], and Dynamic RAMs (DRAMs) [3], respectively. However, in many real-world applications, this guardband is extremely conservative and eliminating it can result in significant power savings without any overhead. Motivated by these studies, we aim to extend the undevolting technique to commercial FPGAs. Toward this goal, we will practically demonstrate the voltage guardband for a representative Xilinx FPGA, with a preliminary concentration on on-chip memories, or Block RAMs (BRAMs).
dc.description.peerreviewedPeer Reviewed
dc.description.sponsorshipWe thank Pradip Bose, Alper Buyuktosunoglu, and Augusto Vega from IBM Watson for their contribution to this work. The research leading to these results has received funding from the European Union’s Horizon 2020 Programme under the LEGaTO Project (www.legato-project.eu), grant agreement nº 780681.
dc.description.versionPostprint (author's final draft)
dc.format.extent2 p.
dc.identifier.citationSalami, B.; Unsal, O.; Cristal, A. A Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs. A: "2018 28th International Conference on Field Programmable Logic and Applications (FPL)". IEEE, 2018, p. 451-452.
dc.identifier.doi10.1109/FPL.2018.00085
dc.identifier.isbn978-1-5386-8517-4
dc.identifier.urihttps://hdl.handle.net/2117/130844
dc.language.isoeng
dc.publisherIEEE
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/780681/EU/Low Energy Toolset for Heterogeneous Computing/LEGaTO
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/8530793
dc.rights.accessOpen Access
dc.subjectÀrees temàtiques de la UPC::Informàtica
dc.subject.lcshHigh performance computing
dc.subject.lemacSupercomputadors
dc.subject.otherField programmable gate arrays
dc.subject.otherRandom access memory
dc.subject.otherVoltage control
dc.subject.otherReliability
dc.subject.otherVoltage measurement
dc.subject.otherSystem-on-chip
dc.subject.otherCircuit faults
dc.titleA Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs
dc.typeConference lecture
dspace.entity.typePublication
local.citation.endingPage452
local.citation.publicationName2018 28th International Conference on Field Programmable Logic and Applications (FPL)
local.citation.startingPage451
local.identifier.drac28608854

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