A Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs
| dc.contributor.author | Salami, Behzad |
| dc.contributor.author | Unsal, Osman Sabri |
| dc.contributor.author | Cristal Kestelman, Adrián |
| dc.contributor.other | Barcelona Supercomputing Center |
| dc.contributor.other | Universitat Politècnica de Catalunya. Doctorat en Arquitectura de Computadors |
| dc.date.accessioned | 2019-03-26T10:10:26Z |
| dc.date.available | 2019-03-26T10:10:26Z |
| dc.date.issued | 2018-12-06 |
| dc.description.abstract | The power consumption of digital circuits, e.g., Field Programmable Gate Arrays (FPGAs), is directly related to their operating supply voltages. On the other hand, usually, chip vendors introduce a conservative voltage guardband below the standard nominal level to ensure the correct functionality of the design in worst-case process and environmental scenarios. For instance, this voltage guardband is empirically measured to be 12%, 20%, and 16% of the nominal level in commercial CPUs [1], Graphics Processing Units (GPUs) [2], and Dynamic RAMs (DRAMs) [3], respectively. However, in many real-world applications, this guardband is extremely conservative and eliminating it can result in significant power savings without any overhead. Motivated by these studies, we aim to extend the undevolting technique to commercial FPGAs. Toward this goal, we will practically demonstrate the voltage guardband for a representative Xilinx FPGA, with a preliminary concentration on on-chip memories, or Block RAMs (BRAMs). |
| dc.description.peerreviewed | Peer Reviewed |
| dc.description.sponsorship | We thank Pradip Bose, Alper Buyuktosunoglu, and Augusto Vega from IBM Watson for their contribution to this work. The research leading to these results has received funding from the European Union’s Horizon 2020 Programme under the LEGaTO Project (www.legato-project.eu), grant agreement nº 780681. |
| dc.description.version | Postprint (author's final draft) |
| dc.format.extent | 2 p. |
| dc.identifier.citation | Salami, B.; Unsal, O.; Cristal, A. A Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs. A: "2018 28th International Conference on Field Programmable Logic and Applications (FPL)". IEEE, 2018, p. 451-452. |
| dc.identifier.doi | 10.1109/FPL.2018.00085 |
| dc.identifier.isbn | 978-1-5386-8517-4 |
| dc.identifier.uri | https://hdl.handle.net/2117/130844 |
| dc.language.iso | eng |
| dc.publisher | IEEE |
| dc.relation.projectid | info:eu-repo/grantAgreement/EC/H2020/780681/EU/Low Energy Toolset for Heterogeneous Computing/LEGaTO |
| dc.relation.publisherversion | https://ieeexplore.ieee.org/document/8530793 |
| dc.rights.access | Open Access |
| dc.subject | Àrees temàtiques de la UPC::Informàtica |
| dc.subject.lcsh | High performance computing |
| dc.subject.lemac | Supercomputadors |
| dc.subject.other | Field programmable gate arrays |
| dc.subject.other | Random access memory |
| dc.subject.other | Voltage control |
| dc.subject.other | Reliability |
| dc.subject.other | Voltage measurement |
| dc.subject.other | System-on-chip |
| dc.subject.other | Circuit faults |
| dc.title | A Demo of FPGA Aggressive Voltage Downscaling: Power and Reliability Tradeoffs |
| dc.type | Conference lecture |
| dspace.entity.type | Publication |
| local.citation.endingPage | 452 |
| local.citation.publicationName | 2018 28th International Conference on Field Programmable Logic and Applications (FPL) |
| local.citation.startingPage | 451 |
| local.identifier.drac | 28608854 |
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