POS1 - Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices

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dc.contributor.authorOleszczuk, Alexander Stephan
dc.contributor.authorThouabtia, Mohamed
dc.contributor.authorAllinger, Martin
dc.contributor.authorRöber, Jürgen
dc.contributor.authorWeigel, Robert
dc.date.accessioned2022-07-08T08:11:00Z
dc.date.issued2022-05
dc.description.abstractIn this paper, we introduce a novel design for test (DFT) concept to check the compliance of wireless-body-areanetwork devices for medical applications with the spectral mask for IR-UWB and FM-UWB defined in chapter 9.13 of the IEEE Std. 802.15.6-2012. The design enables a fast and repeatable ICproduction test solution for medium to high volume testing, which is independent of the tester type and does not need any extra circuitry on a test board / device interface board.
dc.format.extent2 p.
dc.identifier.citationOleszczuk, A.S. [et al.]. POS1 - Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices. A: 27th IEEE European Test Symposium (ETS). 2022,
dc.identifier.urihttps://hdl.handle.net/2117/372117
dc.language.isoeng
dc.relation.publisherversionhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
dc.rights.accessRestricted access - publisher's policy
dc.rights.licensenameAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject.lcshMicroelectronics
dc.subject.lcshIntegrated circuits
dc.subject.lcshSpintronics
dc.subject.lemacMicroelectrònica
dc.subject.lemacCircuits integrats
dc.subject.lemacEspintrònica
dc.subject.otherUltra-Wideband (UWB)
dc.subject.otherRF
dc.subject.otherWireless-Body-Area-Network (WBAN)
dc.subject.otherDesign For Test (DFT)
dc.subject.otherPulse-Position-Modulation (PPM)
dc.subject.otherProduction-Test
dc.subject.otherTest
dc.subject.otherIR-UWB
dc.subject.otherFM-UWB
dc.titlePOS1 - Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices
dc.typeConference report
dspace.entity.typePublication
local.citation.contributor27th IEEE European Test Symposium (ETS)

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27th IEEE European Test Symposium (ETS): Barcelona, 23-27 may, 2022