POS2 - A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage

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dc.contributor.authorJeong, Gyohun
dc.contributor.authorKim, Sangmin
dc.contributor.authorKim, Hyelyun
dc.contributor.authorLee, Sunghee
dc.date.accessioned2022-07-08T08:15:00Z
dc.date.issued2022-05
dc.description.abstractIn this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.
dc.format.extent2 p.
dc.identifier.citationJeong, G. [et al.]. POS2 - A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage. A: 27th IEEE European Test Symposium (ETS). 2022,
dc.identifier.urihttps://hdl.handle.net/2117/372125
dc.language.isoeng
dc.relation.publisherversionhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
dc.rights.accessRestricted access - publisher's policy
dc.rights.licensenameAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject.lcshMicroelectronics
dc.subject.lcshIntegrated circuits
dc.subject.lcshSpintronics
dc.subject.lemacMicroelectrònica
dc.subject.lemacCircuits integrats
dc.subject.lemacEspintrònica
dc.subject.otherSolid state drive
dc.subject.otherFirmware
dc.subject.otherTest case
dc.subject.otherFunction coverage
dc.subject.otherI/O workload
dc.subject.otherClustering
dc.titlePOS2 - A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage
dc.typeConference report
dspace.entity.typePublication
local.citation.contributor27th IEEE European Test Symposium (ETS)

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27th IEEE European Test Symposium (ETS): Barcelona, 23-27 may, 2022