Black-Box IP Validation with the SafeTI Traffic Injector: A Success Story
| dc.contributor.author | Fuentes, Francisco |
| dc.contributor.author | Alcaide Portet, Sergi |
| dc.contributor.author | Casanova, Raimon |
| dc.contributor.author | Abella Ferrer, Jaume |
| dc.contributor.other | Barcelona Supercomputing Center |
| dc.date.accessioned | 2023-11-30T15:22:46Z |
| dc.date.available | 2023-11-30T15:22:46Z |
| dc.date.issued | 2023 |
| dc.description.abstract | Functional and performance validation of high-performance safety-related hardware platforms require generating specific traffic patterns in the network-on-chip (NoC) to test IP components and their integration. Software-only tests offer indirect control on the NoC traffic and are subject to numerous constraints (e.g., the inability to inject bursty traffic synchronously since cores may not be able to generate it explicitly). Instead, hardware traffic injectors, such as the SafeTI are much more versatile and controllable.This paper presents how our SafeTI hardware traffic injector can be used for the validation of an L2 cache in a safety-relevant space MPSoC by Frontgrade Gaisler, and how such validation process allowed identifying a hard-to-detect design flaw that led to decreased available cache space. Overall, our experience shows a specific application of the SafeTI for black-box IP validation and a success story for that application. |
| dc.description.peerreviewed | Peer Reviewed |
| dc.description.sponsorship | This work is part of the project (ISOLDE), funded by MCIN/AEI/10.13039/501100011033 and the European Union NextGenerationEU/PRTR under grant PCI2023-143372, and the European Union’s Horizon Europe Programme under project KDT Joint Undertaking (JU) under grant agreement No 101112274. This work has also been partially supported by the Spanish Ministry of Science and Innovation under grant PID2019-107255GB-C21 funded by MCIN/AEI/10.13039/501100011033. |
| dc.description.version | Postprint (author's final draft) |
| dc.identifier.citation | Fuentes, F. [et al.]. Black-Box IP Validation with the SafeTI Traffic Injector: A Success Story. A: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). "2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT): Juan-Les-Pins, France October 3 2023 to October 5 2023: proceedings.". Institute of Electrical and Electronics Engineers (IEEE), 2023, ISBN 979-8-3503-1500-4. DOI 10.1109/DFT59622.2023.10313565. |
| dc.identifier.doi | 10.1109/DFT59622.2023.10313565 |
| dc.identifier.isbn | 979-8-3503-1500-4 |
| dc.identifier.uri | https://hdl.handle.net/2117/397442 |
| dc.language.iso | eng |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| dc.relation.projectid | info:eu-repo/grantAgreement/EC/HE/101112274/EU/High Performance, Safe, Secure, Open-Source Leveraged RISC-V Domain-Specific Ecosystems/ISOLDE |
| dc.relation.projectid | info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-107255GB-C21/ES/BSC - COMPUTACION DE ALTAS PRESTACIONES VIII/ |
| dc.relation.publisherversion | https://www.computer.org/csdl/proceedings/dft/2023/1S4hT0DAvwQ |
| dc.rights.access | Open Access |
| dc.subject | Àrees temàtiques de la UPC::Informàtica::Hardware |
| dc.subject.lcsh | High performance computing |
| dc.subject.lcsh | Open Source |
| dc.subject.lemac | Sistemes adaptatius |
| dc.subject.other | Fault tolerant systems |
| dc.subject.other | Closed box |
| dc.subject.other | Process control |
| dc.subject.other | Network-on-chip |
| dc.subject.other | Aerospace electronics |
| dc.subject.other | Very large scale integration |
| dc.subject.other | Traffic control |
| dc.title | Black-Box IP Validation with the SafeTI Traffic Injector: A Success Story |
| dc.type | Conference lecture |
| dspace.entity.type | Publication |
| local.citation.contributor | IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| local.citation.publicationName | 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT): Juan-Les-Pins, France October 3 2023 to October 5 2023: proceedings. |
Fitxers
Paquet original
1 - 1 de 1
Carregant...
- Nom:
- SafeTI_DFTSCongress.pdf
- Mida:
- 224.14 KB
- Format:
- Adobe Portable Document Format
- Descripció:



