Exploiting dimensionality and defect mitigation to create tunable microwave dielectrics

dc.contributor.authorLee, Che-Hui
dc.contributor.authorOrloff, Nathan D.
dc.contributor.authorBirol, Turan
dc.contributor.authorRocas Cantenys, Eduard
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2014-01-10T15:16:09Z
dc.date.created2013-10
dc.date.issued2013-10
dc.description.abstractThe miniaturization and integration of frequency-agile microwave circuits-relevant to electronically tunable filters, antennas, resonators and phase shifters-with microelectronics offers tantalizing device possibilities, yet requires thin films whose dielectric constant at gigahertz frequencies can be tuned by applying a quasi-static electric field. Appropriate systems such as BaxSr1-xTiO3 have a paraelectric-ferroelectric transition just below ambient temperature, providing high tunability. Unfortunately, such films suffer significant losses arising from defects. Recognizing that progress is stymied by dielectric loss, we start with a system with exceptionally low loss-Srn+1TinO3n+1 phases-in which (SrO)2 crystallographic shear planes provide an alternative to the formation of point defects for accommodating non-stoichiometry. Here we report the experimental realization of a highly tunable ground state arising from the emergence of a local ferroelectric instability in biaxially strained Srn+1TinO3n+1 phases with n = 3 at frequencies up to 125 GHz. In contrast to traditional methods of modifying ferroelectrics-doping or strain-in this unique system an increase in the separation between the (SrO)2 planes, which can be achieved by changing n, bolsters the local ferroelectric instability. This new control parameter, n, can be exploited to achieve a figure of merit at room temperature that rivals all known tunable microwave dielectrics.
dc.description.peerreviewedPeer Reviewed
dc.description.versionPostprint (published version)
dc.format.extent5 p.
dc.identifier.citationLee, C. [et al.]. Exploiting dimensionality and defect mitigation to create tunable microwave dielectrics. "Nature", Octubre 2013, vol. 502, núm. 7472, p. 532-536.
dc.identifier.doi10.1038/nature12582
dc.identifier.issn0028-0836
dc.identifier.urihttps://hdl.handle.net/2117/21213
dc.language.isoeng
dc.relation.publisherversionhttp://www.nature.com/nature/journal/v502/n7472/full/nature12582.html
dc.rights.accessRestricted access - publisher's policy
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject.lcshMicrowave integrated circuits
dc.subject.lcshMicroelectronics
dc.subject.lemacCircuits integrats de microones
dc.subject.lemacMicroelectrònica
dc.titleExploiting dimensionality and defect mitigation to create tunable microwave dielectrics
dc.typeArticle
dspace.entity.typePublication
local.citation.authorLee, C.; Orloff, N.; Birol, T.; Rocas, E.
local.citation.endingPage536
local.citation.number7472
local.citation.publicationNameNature
local.citation.startingPage532
local.citation.volume502
local.identifier.drac12908920

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