Now showing items 1-2 of 2

    • An approach to dynamic power consumption current testing of CMOS ICs 

      Segura, J A; ROCA, M; Mateo Peña, Diego; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 1995)
      Conference report
      Open Access
      I/sub DDQ/ testing is a powerful strategy for detecting defects that do not alter the logic behavior of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some opens can ...
    • Quiescent current analysis and experimentation of defective CMOS circuits 

      Segura, J A; Champac, V H; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Rubio Sola, Jose Antonio (1992-12)
      Article
      Restricted access - publisher's policy
      Physical defects widely encountered in today's CMOS processes (bridges, gate oxide short (gas) and floating gates) are modeled taking into account the topology of the defective circuit and the parameters of the technology. ...