Now showing items 1-4 of 4

    • Establishing nanoscale heterogeneity with nanoscale force measurements 

      Chang, Yun-Hsiang, Yun-Hsiang; Olukan, Tuza; Lai, Chia-Yun; Santos, Sergio; Lin, Tze-Yu; Apostoleris, Harry; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2015-08-13)
      Article
      Open Access
      Establishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters ...
    • Periodicity in bimodal atomic force microscopy 

      Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
      Article
      Open Access
      Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ...
    • Probing power laws in multifrequency AFM 

      Santos, Sergio; Gadelrab, Karim Raafat; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-02-17)
      Article
      Open Access
      Quantification of conservative forces in multifrequency atomic force microscopy requires solving the general equations of the theory expressed in terms of the virials of interaction. Power law expressions are commonly ...
    • Single cycle and transient force measurements in dynamic atomic force microscopy 

      Gadelrab, Karim Raafat; Santos, Sergio; Font Teixidó, Josep; Chiesa, Matteo (2013-11-21)
      Article
      Open Access
      The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments ...