Browsing by Author "Rajski, Janusz"
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S1 - X-Masking for In-System Deterministic Test
Mrugalski, Grzegorz; Rajski, Janusz; Tyszer, Jerzy; Włodarczak, Bartosz (2022-05)
Conference report
Restricted access - publisher's policyIn-system deterministic tests are used in safetysensitive designs to assure high test coverage, short test time, and low data volume, typically through an input-streaming-only approach that allows a quick test delivery. ...