Browsing by Author "ROCA, M"

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    • An approach to dynamic power consumption current testing of CMOS ICs 

      Segura, J A; ROCA, M; Mateo Peña, Diego; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 1995)
      Conference report
      Open Access
      I/sub DDQ/ testing is a powerful strategy for detecting defects that do not alter the logic behavior of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some opens can ...