Exploració per autor "Mir, S."
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Defect-oriented non-intrusive RF test using on-chip temperature sensors
Abdallah, L.; Stratigopoulos, H. G.; Mir, S.; Altet Sanahujes, Josep (Institute of Electrical and Electronics Engineers (IEEE), 2013)
Text en actes de congrés
Accés restringit per política de l'editorialWe present a built-in, defect-oriented test approach for RF circuits that is based on thermal monitoring. A defect will change the power dissipation of the circuit under test from its expected range of values which, in ...