Browsing by Author "Levecq, Xavier"
Depth aberrations characterization in linear and nonlinear microscopy schemes using a Shack-Hartmann wavefront sensor Aviles Espinosa, Rodrigo; Andilla, Jordi; Porcar-Guezenec, Rafael; Levecq, Xavier; Artigas García, David; Loza Álvarez, Pablo (2012)
Restricted access - publisher's policyThe performance of imaging devices such as linear and nonlinear microscopes (NLM) can be limited by the optical properties of the imaged sample. Such an important aspect has already been described using theoretical models ...
Measurement and correction of in vivo sample aberrations employing a nonlinear guide-star in two-photon excited fluorescence microscopy Aviles Espinosa, Rodrigo; Andilla, Jordi; Porcar-Guezenec, Rafael; Olarte, Omar E.; Nieto, Marta; Levecq, Xavier; Artigas García, David; Loza Álvarez, Pablo (2011-11-01)
Open AccessWe demonstrate that sample induced aberrations can be measured in a nonlinear microscope. This uses the fact that two-photon excited fluorescence naturally produces a localized point source inside the sample: the nonlinear ...