Exploració per autor "Lafon, F."
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Design of a 20 GHz DPI method for SOIC8
Land, S.O.; Perdriau, R.; Ramdani, M.; Gil Galí, Ignacio; Lafon, F. (2012)
Text en actes de congrés
Accés obertThe direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1 GHz. As the frequency of functional and interference signals is increasing, we would like ...