Browsing by Subject "Integrated circuits--Testing"

Now showing items 1-3 of 3

    • Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals 

      Champac Vilela, Víctor Hugo; Avendaño, Victor; Figueras Pàmies, Joan (2010-02)
      Article
      Open Access
      Testing of signal integrity (SI) in current high-speed ICs, requires automatic test equipment test resources at the multigigahertz range, normally not available. Furthermore, for most internal nets of state-of-the-art ...

    • Estudi de la viabilitat sobre reparació en l’electrònica: elaboració de l’IC tester 

      Gimeno Peredo, Cristian (Universitat Politècnica de Catalunya, 2020-02-06)
      Bachelor thesis
      Open Access
      L’objectiu del treball exposat a continuació és el de construir un testejador de circuits integrats anomenat IC-Tester, una eina molt útil per a la reparació de circuits electrònics. La gran majoria d’aparells electrònics ...

    • Post-Bond test of through-silicon vias with open defects 

      Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan (2014)
      Conference report
      Restricted access - publisher's policy
      Through Silicon Vias (TSVs) are critical elements in three dimensional integrated circuits (3-D ICs) and are susceptible to undergo defects at different stages: during their own fabrication, the bonding stage or during ...