Browsing by Author "Girard, Patrick"
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POS2 - Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud (2022-05)
Conference report
Restricted access - publisher's policyIn-field test of integrated circuits using Self-Test Libraries (STLs) is a widely used technique specifically suited to guarantee the processor’s correct behavior during the operative lifetime, as mandated by functional ...