Browsing by Author "Girard, P."

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    • POS1 - A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors 

      Lefevre, J.; Debaud, P.; Girard, P.; Virazel, A. (2022-05)
      Conference report
      Restricted access - publisher's policy
      This paper demonstrates the generalization of a novel test solution embedded inside CMOS Image Sensors (CIS) to classify PASS/FAIL sensors during the test production phase. In [1], a Built-In Self-Test (BIST) solution ...