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  • Design and implementation of automatic test equipment IP module 

    Fransi Palos, Sergi; Farre Lozano, Goretti; Garcia Deiros, Lucas; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2010-05-24)
    Conference lecture
    Restricted access - publisher's policy
    This paper presents an Intellectual Property (IP) module that includes fully functional autonomous Automatic Test Equipment (ATE). The module analyses responses from the Device Under Test (DUT) after sending test vectors ...