Now showing items 1-2 of 2

  • Energy macro-model for on chip interconnection buses 

    Mendoza Vázquez, Raymundo; Pons Solé, Marc; Moll Echeto, Francisco de Borja; Figueras, Joan (2006-06)
    External research report
    Open Access
    This report presents a fast method of evaluating the power consumption of a bus. Given an on-chip bus driver-interconnection-receiver design of N parallel lines,the objective is to develop its energy consumption macro-model. ...
  • Test escapes of stuck-open faults caused by parasitic capacitances and leakage currents 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras, Joan (2015-09-24)
    Article
    Open Access
    Intragate open defects are responsible for a significant percentage of defects in present technologies. A majority of these defects causes the logic gate to become stuck open, and this is why they are traditionally modeled ...