Now showing items 1-2 of 2

    • Reliability issues in RRAM ternary memories affected by variability and aging mechanisms 

      Rubio Sola, Jose Antonio; Escudero, Manuel; Pouyan, Peyman (Institute of Electrical and Electronics Engineers (IEEE), 2017)
      Conference report
      Open Access
      Resistive switching Random Access Memories (RRAM) are being considered as a promising alternative for conventional memories mainly due to their high speed, scalability, CMOS compatibility, Non-Volatile behavior (NVM), and ...
    • Stuck-at-off fault analysis in memristor-based architecture for synchronization 

      Escudero, Manuel; Vourkas, Ioannis; Rubio Gimeno, Alberto (Institute of Electrical and Electronics Engineers (IEEE), 2019)
      Conference report
      Restricted access - publisher's policy
      Nonlinear circuits may be interconnected and organized in networks to couple their dynamics and achieve synchronization, a process that is commonly observed in nature. Recent works have shown that memristors may be used ...