Now showing items 1-9 of 9

    • A novel FPGA-based high throughput accelerator for binary search trees 

      Melikoglu, Oyku; Ergin, Oguz; Salami, Behzad; Pavón Rivera, Julián; Unsal, Osman Sabri; Cristal Kestelman, Adrián (Institute of Electrical and Electronics Engineers (IEEE), 2019)
      Conference report
      Open Access
      This paper presents a deeply pipelined and massively parallel Binary Search Tree (BST) accelerator for Field Programmable Gate Arrays (FPGAs). Our design relies on the extremely parallel on-chip memory, or Block RAMs (BRAMs) ...
    • An experimental study of reduced-voltage operation in modern FPGAs for neural network acceleration 

      Salami, Behzad; Onural, Erhan Baturay; Yuksel, Ismail Emir; Koc, Fahrettin; Ergin, Oguz; Cristal Kestelman, Adrián; Unsal, Osman Sabri; Sarbazi-Azad, Hamid; Mutlu, Onur (Institute of Electrical and Electronics Engineers (IEEE), 2020)
      Conference report
      Open Access
      We empirically evaluate an undervolting technique, i.e., underscaling the circuit supply voltage below the nominal level, to improve the power-efficiency of Convolutional Neural Network (CNN) accelerators mapped to Field ...
    • Compiler directed early register release 

      Jones, Timothy M.; O’Boyle, Michael F.P.; Abella Ferrer, Jaume; González Colás, Antonio María; Ergin, Oguz (Institute of Electrical and Electronics Engineers (IEEE), 2005)
      Conference report
      Open Access
      This paper presents a novel compiler directed technique to reduce the register pressure and power of the register file by releasing registers early. The compiler identifies registers that mil only be read once and renames ...
    • Empowering a helper cluster through data-width aware instruction selection policies 

      Unsal, Osman Sabri; Ergin, Oguz; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Computer Society, 2006)
      Conference report
      Open Access
      Narrow values that can be represented by less number of bits than the full machine width occur very frequently in programs. On the other hand, clustering mechanisms enable cost- and performance-effective scaling of processor ...
    • Exploiting narrow values for soft error tolerance 

      Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2006-07)
      Article
      Open Access
      Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...
    • Fuse: A technique to anticipate failures due to degradation in ALUs 

      Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2007)
      Conference report
      Open Access
      This paper proposes the fuse, a technique to anticipate failures due to degradation in any ALU (arithmetic logic unit), and particularly in an adder. The fuse consists of a replica of the weakest transistor in the adder ...
    • Impact of parameter variations on circuits and microarchitecture 

      Unsal, Osman Sabri; Tschanz, James W.; Bowman, Keith; De, Vivek; Vera Rivera, Francisco Javier; González Colás, Antonio María; Ergin, Oguz (2006-12)
      Article
      Open Access
      Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace ...
    • Reducing soft errors through operand width aware policies 

      Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-09)
      Article
      Open Access
      Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...
    • Refueling: Preventing wire degradation due to electromigration 

      Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María; Tschanz, James W. (2008-12)
      Article
      Open Access
      Electromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing ...