Now showing items 1-6 of 6

  • All-digital DSP-based phase-locked loop for induction heating applications 

    Martín Segura, Guillermo; Sala Pérez, Pau; Ferrater Simón, María Misericordia; López Mestre, Joaquim; Bergas Jané, Joan Gabriel; Montesinos Miracle, Daniel (2012)
    Article
    Restricted access - publisher's policy
    Phase-locked loop schemes are widely used in induction heating applications for controlling the converters. Most authors use total or partial analog solutions to implement the control schemes, which are less sturdy and ...
  • Analog circuit test based on a digital signature 

    Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2010)
    Conference report
    Open Access
    Production verification of analog circuit specifica- tions is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost on-chip parameter verification ...
  • Criteria for indirect measurements in M-S testing 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
    Conference report
    Restricted access - author's decision
    Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog ...
  • Disseny d'un dispositiu de baix cost per a la transmissió de dades a través de línies de potència 

    Ortega César, José María (Universitat Politècnica de Catalunya, 2017)
    Master thesis (pre-Bologna period)
    Open Access
    En aquest projecte es proposa un sistema per a comunicar dades entre dos dispositius a través de la xarxa elèctrica (230VAC en Europa) d'una forma simple, assequible i oberta. En termes generals, aquest camp d’estudi es ...
  • Shape effects on electromigration in VLSI interconnects 

    González Jiménez, José Luis; Rubio Sola, Jose Antonio (1997-07)
    Article
    Restricted access - publisher's policy
    The influence of the shape of VLSI interconnects on the lifetime due to electromigration is investigated. Simulations and experiments indicate that, in some cases, the right angle corners of the metal lines, widely ...
  • Sistema de detecció de tocats per a esgrima en la modalitat de floret 

    Ojeda Esquerdo, Bàrbara (Universitat Politècnica de Catalunya, 2017-01)
    Bachelor thesis
    Restricted access - confidentiality agreement