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    • Resistive open defect characteritzation in 3D 6T SRAM memories 

      Castillo, Raúl; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa (2014)
      Conference report
      Restricted access - publisher's policy
      The relentless decrease in feature size and the increase of density requirements in Integrated Circuit (IC) manufacturing arise new challenges that must be overcome. One of the most promising alternatives is three-dimensional ...