Now showing items 1-2 of 2

    • S7 - Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 

      Bernardi, P.; Insinga, G.; Paganini, G.; Cantoro, R.; Beer, P.; Coppetta, M.; Mautone, N.; Carnevale, G.; Scaramuzza, P.; Ullmann, R. (2022-05)
      Conference report
      Restricted access - publisher's policy
      Embedded memories in Automotive Systems-on-Chip usually occupy a large die area portion. Consequently, their defectivity can strongly impact production yield for any automotive device. Along with the technology ramp-up ...
    • SP2 - Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 

      Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R. (2022-05)
      Conference report
      Restricted access - publisher's policy
      This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability ...