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  • Direct extraction of all four transistor noise parameters from 50 noise figure measurements 

    Lázaro Guillén, Antoni; Pradell i Cara, Lluís; Beltrán, A.; O'Callaghan Castellà, Juan Manuel (IEE, 1998-02-05)
    Open Access
    A new method for measuring the four noise parameters (NPs) of a transistor is presented. It is based on the determination of its intrinsic noise matrix elements (C11INT, C22INT, Re(C12INT), Im(C12INT)) by fitting the ...