• Effect of current distortion and unbalanced loads on semiconductors reliability 

      Lledó Ponsati, Tomàs; Bahman, Amir Sajjad; Lannuzzo, Francesco; Montesinos Miracle, Daniel; Galceran Arellano, Samuel (Institute of Electrical and Electronics Engineers (IEEE), 2021-01-01)
      Artículo
      Acceso abierto
      This article presents a reliability analysis of a 4-wire grid-tied inverter under different loading conditions, considering unbalanced loads and harmonic distortion in the current consumed. The proposed power converter is ...
    • Thermal modeling of large electrolytic capacitors using FEM and considering the internal geometry 

      Lledó Ponsati, Tomàs; Bahman, Amir Sajjad; Iannuzzo, Francesco; Montesinos Miracle, Daniel; Galceran Arellano, Samuel (Institute of Electrical and Electronics Engineers (IEEE), 2021-06-16)
      Artículo
      Acceso abierto
      This article focuses on developing a finite-element method (FEM) model for large capacitors’ thermal modeling and reliability analysis. Thermal modeling for capacitors is critical since the capacitor’s lifetime depends on ...