• Noise model of a reverse-biased Cold-FET applied to the characterization of its ENR 

    Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís (JOHN WILEY & SONS INC, 2004-02-28)
    Article
    Accés obert
    This paper presents a broadband-noise circuit model for a cold-FET (Vds = 0 V) with a reverse-biased gate. The noise model includes two intrinsic uncorrelated noise-current sources whose spectral densities are determined ...