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  • Improving indirect test efficiency using multi-directional tessellations in the measure space 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016)
    Conference report
    Restricted access - publisher's policy
    Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the ...