Exploració per tema "Mixed signal circuits"

Ara es mostren els items 1-6 de 6

    • Assembly, Integration, Verification, and Testing of a 1P PocketQube 

      Mateo Vazquez, Sergio (Universitat Politècnica de Catalunya, 2023-07-05)
      Treball Final de Grau
      Accés obert
      The project developed in this thesis consists of the assembly, integration, verification and testing of the different subsystems of a PocketQube (Electrical Power Supply, Altitude Determination and Control System, On-Board ...

    • Criteria for indirect measurements in M-S testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
      Text en actes de congrés
      Accés restringit per decisió de l'autor
      Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog ...

    • Efficient production binning using octree tessellation in the alternate measurements space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2015)
      Article
      Accés obert
      Binning after volume production is a widely accepted technique to classify fabricated ICs into different clusters depending on different degrees of specification compliance. This allows the manufacturer to sell non optimal ...

    • Mismatch and dynamic modeling of current sources in current-steering cmos d/a converters: an extended design procedure 

      Albiol, Miquel; González Jiménez, José Luis; Alarcón Cot, Eduardo José (2004-01)
      Article
      Accés restringit per política de l'editorial
      This paper presents an improved modeling of the effect of random mismatch and current source transient switching behavior on the performance of current-steering CMOS digital-toanalog converters (DACs). The work considers ...

    • Mixed-signal test band guarding using digitally coded indirect measurements 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...

    • Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
      Article
      Accés restringit per política de l'editorial
      One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ...