• Autoencoder based feature reduction analysis applied to electromechanical systems condition monitoring 

      Arellano Espitia, Francisco; Saucedo Dorantes, Juan Jose; Delgado Prieto, Miquel; Osornio Rios, Roque A. (Institute of Electrical and Electronics Engineers (IEEE), 2019)
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      Condition monitoring in electromechanical systems represents, currently, one of the most critical challenges dealing with the advancement and modernization in intelligent manufacturing. In this regard, machine learning ...