• Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery 

      Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
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      The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling ...