Exploració per tema "10x reductions"

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    • REEM: failure/non-failure region estimation method for SRAM yield analysis 

      Rana, Manish; Canal Corretger, Ramon (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      The big challenge that we face today for designing resilient memories is the huge number of simulations needed to arrive at a good estimate of memory's yield. A lot of work has come up recently focusing on the reduction ...