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  • Extraction of an avalanche diode noise model for its application as on-wafer noise source 

    Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís (JOHN WILEY & SONS INC, 2003-07-31)
    Open Access
    This paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on-wafer noise source. It is based on the determination of a broadband device noise ...