• Fault-tolerance capacity of the multilevel active-clamped topology 

      Nicolás Apruzzese, Joan; Busquets Monge, Sergio; Bordonau Farrerons, José; Alepuz Menéndez, Salvador; Calle Prado, Alejandro (IEEE Press. Institute of Electrical and Electronics Engineers, 2011)
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      Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. ...