• Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers 

    Martín Martínez, Javier; Diaz, Javier; Rodríguez, Rosana; Nafria, Montse; Aymerich Humet, Xavier; Roca Moreno, Elisenda; Fernández Fernández, Francisco V.; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2014)
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    A new method for the analysis of multilevel Random Telegraph Noise (RTN) signals has been recently presented, which can also be applied in the case of large background noise. In this work, the method is extended to evaluate ...
  • Experimental Characterization of NBTI Effect on pMOSFET and CMOS Inverter 

    Fernández García, Raúl; Kaczer, Ben; Gago Barrio, Javier; Rodríguez, Rosana; Nafría Maqueda, Montserrat (2009-02)
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