• Diagnosis of full open defects in interconnect lines with fan-out 

      Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram (IEEE Press. Institute of Electrical and Electronics Engineers, 2010-05-24)
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      The development of accurate diagnosis methodologies is important to solve process problems and achieve fast yield improvement. As open defects are common in CMOS technologies, accurate diagnosis of open defects becomes ...
    • Diagnosis of full open defects in interconnecting lines 

      Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram; Lousberg, M.; Majhi, A.K. (IEEE, 2007-05-31)
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      A proposal for enhancing the diagnosis of full open defects in interconnecting lines of CMOS circuits is presented. The defective line is first classified as fully opened by means of a logic-based diagnosis tool (Faloc). ...
    • Gate leakage impact on full open defects in interconnect lines 

      Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram (2011-06)
      Article
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      An Interconnect full open defect breaks the connection between the driver and the gate terminals of downstream transistors, generating a floating line. The behavior of floating lines is known to depend on several factors, ...
    • P2 - Can DPPM of AMS Circuits Be Accurately Estimated From Their Defect Coverage? 

      Zivkovic, Vladimir; Kruseman, Bram; Sunter, Stephen; Draxelmayr, Dieter; Stratigopoulos, Haralampos; Bhattacharya, Mayukh (2022-05)
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      Estimation of Defective Parts Per Million (DPPM) for digital circuits is no longer a straightforward task for nanotechnologies, even with the help of Williams-Brown or Seth-Agarwal formulas, ATPG and wellestablished fault ...