Exploració per autor "Gutsch, Sebastian"

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    • Determination of shape and sphericity of silicon quantum dots imaged by EFTEM-tomography 

      Ayala Vallespí, M. Dolors; Hiller, Daniel; Gutsch, Sebastian; López Vidrier, Julián; Zacharias, Margit; Estradé Albiol, Sònia; Peiró Martínez, Francesca; Cruz-Matías, Irving (2017-11-06)
      Article
      Accés obert
      The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by ...

    • Sphericity and roundness computation for particles using the extreme vertices model 

      Cruz Matías, Irving; Ayala Vallespí, M. Dolors; Hiller, Daniel; Gutsch, Sebastian; Zacharias, Margit; Estradé, Sònia; Peiró Martínez, Francesca (Elsevier, 2019-01-01)
      Article
      Accés obert
      Shape is a property studied for many kinds of particles. Among shape parameters, sphericity and roundness indices had been largely studied to understand several processes. Some of these indices are based on length measurements ...