• Discriminative learning of deep convolutional feature point descriptors 

      Simó Serra, Edgar; Trulls Fortuny, Eduard; Ferraz, Luis; Kokkinos, Iasonas; Fua, Pascal; Moreno-Noguer, Francesc (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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      Accés obert
      Deep learning has revolutionalized image-level tasks such as classification, but patch-level tasks, such as correspondence, still rely on hand-crafted features, e.g. SIFT. In this paper we use Convolutional Neural Networks ...