Now showing items 1-1 of 1

  • Determination of shape and sphericity of silicon quantum dots imaged by EFTEM-tomography 

    Ayala Vallespí, M. Dolors; Hiller, Daniel; Gutsch, Sebastian; López Vidrier, Julián; Zacharias, Margit; Estradé Albiol, Sònia; Peiró Martínez, Francesca; Cruz-Matías, Irving (2017-11-06)
    Article
    Open Access
    The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by ...