Exploració per autor "Bosio, Alberto"
Ara es mostren els items 1-4 de 4
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Cross-layer system reliability assessment framework for hardware faults
Vallero, Alessandro; Savino, Alessandro; Politano, Gianfranco; Di Carlo, Stefano; Chatzidimitriou, Athanansios; Tselonis, Sotiris; Kaliorakis, Manolis; Gizipoulos, Dimitris; Riera Villanueva, Marc; Canal Corretger, Ramon; González Colás, Antonio María; Kooli, Maha; Bosio, Alberto; Di Natale, Giorgio (Institute of Electrical and Electronics Engineers (IEEE), 2016)
Text en actes de congrés
Accés obertSystem reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction ... -
ETS 2022 Foreword
Manich Bou, Salvador; Rodríguez, Rosa; Mir, Salvador; Bernardi, Paolo; Tille, Daniel; Bosio, Alberto (2022-05)
Text en actes de congrés
Accés obert -
ETS 2022 ORGANIZING COMMITTEE
Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bernardi, Paolo; Tille, Daniel; Mir, Salvador; Bosio, Alberto; Arumi Delgado, Daniel; Gómez Pau, Álvaro; Cassano, Luca; Jiao, Hailong; Miclea, Liviu; Sanchez, Ernesto; Savino, Alessandro; Canal Corretger, Ramon; Eggersglüß, Stephan; Fransi, Sergi; Taouil, Mottaqiallah; Calomarde Palomino, Antonio; Weiner, Michael; Michael, Maria K.; Sonza Reorda, Matteo; Larsson, Erik; Vatajelu, Elena-Ioana; Stratigopoulos, Haralampos-G.; Parisi Baradad, Vicenç; Jiao, Hailong; Huang, Junlin; Li, Huawei; Chillarige, Sameer; Kameyama, Shuichi; Carro, Luigi; Su, Fei; Nicolici, Nicola; Huang, Shi-Yu (2022-05)
Text en actes de congrés
Accés obert -
SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems
Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanansios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal Corretger, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano; Anglada Sanchez , Martí; González Colás, Antonio María; Mariani, R. (Institute of Electrical and Electronics Engineers (IEEE), 2018-01-01)
Article
Accés obertCross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different ...