• Energy dissipation in the presence of sub-harmonic excitation in dynamic atomic force microscopy 

    Chiesa, Matteo; Gadelrab, Karim Raafat; Verdaguer, Albert; Segura, Juan José; Barcons Xixons, Víctor; Thomson, Neil H.; Phillips, M.A.; Stefancich, M.; Santos Hernández, Sergio (2012-09)
    Artículo
    Acceso abierto
    Amplitude modulation atomic force microscopy allows quantifying energy dissipation in the nanoscale with great accuracy with the use of analytical expressions that account for the fundamental frequency and higher harmonics. ...
  • How localized are energy dissipation processes in nanoscale interactions? 

    Santos Hernández, Sergio; Barcons Xixons, Víctor; Verdaguer, Albert; Font Teixidó, Josep; Thomson, Neil H.; Chiesa, Mateo (2011-07-29)
    Artículo
    Acceso abierto
    We describe fundamental energy dissipation in dynamic nanoscale processes in terms of the localization of the interactions. In this respect, the areal density of the energy dissipated and the effective area of interaction ...
  • Investigation of nanoscale interactions by means of subharmonic excitation 

    Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
    Artículo
    Acceso restringido por política de la editorial
    Multifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ...
  • Spatial horizons in amplitude and frequency modulation atomic force microscopy 

    Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
    Artículo
    Acceso abierto
    In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ...
  • Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging 

    Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H. (2013)
    Artículo
    Acceso abierto
    A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 ...
  • The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features 

    Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Font Teixidó, Josep; Thomson, Neil H. (2011)
    Artículo
    Acceso abierto
  • Wearing a single DNA molecule with an AFM tip 

    Santos Hernandez, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2015-06)
    Report de recerca
    Acceso abierto
    While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is ...