Exploració per autor "Mir, Salvador"

Ara es mostren els items 1-6 de 6

    • ETS 2022 Foreword 

      Manich Bou, Salvador; Rodríguez, Rosa; Mir, Salvador; Bernardi, Paolo; Tille, Daniel; Bosio, Alberto (2022-05)
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    • ETS 2022 ORGANIZING COMMITTEE 

      Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bernardi, Paolo; Tille, Daniel; Mir, Salvador; Bosio, Alberto; Arumi Delgado, Daniel; Gómez Pau, Álvaro; Cassano, Luca; Jiao, Hailong; Miclea, Liviu; Sanchez, Ernesto; Savino, Alessandro; Canal Corretger, Ramon; Eggersglüß, Stephan; Fransi, Sergi; Taouil, Mottaqiallah; Calomarde Palomino, Antonio; Weiner, Michael; Michael, Maria K.; Sonza Reorda, Matteo; Larsson, Erik; Vatajelu, Elena-Ioana; Stratigopoulos, Haralampos-G.; Parisi Baradad, Vicenç; Jiao, Hailong; Huang, Junlin; Li, Huawei; Chillarige, Sameer; Kameyama, Shuichi; Carro, Luigi; Su, Fei; Nicolici, Nicola; Huang, Shi-Yu (2022-05)
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    • L'EDIF, un format estàndar per a l'intercanvi de dades de dissenys electrònics 

      Mir, Salvador; Mir, Xavier; Rubio Sola, Jose Antonio (Universitat Politècnica de Barcelona. Centre de Càlcul, 1987)
      Article
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      En estos últimos años, el rápido incremento de los sistemas CAE/CAD en el campo de la electrónica ha hecho que la transferencia de información de unos sistemas a otros fuese un problema creciente. En consecuencia, se ha ...

    • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

      Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
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      This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...

    • SP1 - Feature selection techniques for indirect test and statistical calibration of mm-wave integrated circuits 

      Barragan, Manuel J.; Leger, Gildas; Cilici, Florent; Lauga-Larroze, Estelle; Mir, Salvador; Bourdel, Sylvain (2022-05)
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    • Testing RF circuits with true non-intrusive built-in sensors 

      Abdallah, Louay; Stratigopoulos, Haralampos-G.; Mir, Salvador; Altet Sanahujes, Josep (IEEE, 2012)
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      We present a set of sensors that enable a builtin test in RF circuits. The key characteristic of these sensors is that they are non-intrusive, that is, they are not electrically connected to the RF circuit, and, thereby, ...