Exploració per autor "Herzog, M"
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Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current Sensors
Wunderlich, H J; Herzog, M; Figueras Pàmies, Joan; Carrasco, Juan A.; Calderón, A (1995)
Text en actes de congrés
Accés obert"On-Chip" I_{DDQ} testing by the incorporation of Built-In Current (BIC) sensors has some advantages over "off-chip" techniques. However, the integration of sensors poses analog design problems which are hard to be solved ...