Browsing by Subject "Atomic force microscopy"

Now showing items 21-37 of 37

    • Mechanical characterization at nanometric scale of a new design of SOFC 

      Roa Rovira, Joan Josep; Ruíz-Morales, J.C.; Canales-Vázquez, Jesús; Morales, Miguel; Capdevila, X.G.; Núñez, Pedro; Segarra, M. (2011-02-09)
      Article
      Restricted access - publisher's policy
      The mechanical stability is an important parameter to gain knowledge in the potential applications of a novel design of electrolyte-supported SOFC, based on yttria-stabilised zirconia (YSZ) and NiO-YSZ composites, with ...

    • Microcantilever Displacement Measurement Using a Mechanically Modulated Optical Feedback Interferometer 

      Azcona Guerrero, Francisco Javier; Jha, Ajit; Yáñez Alvarado, Carlos René; Atashkhooei, Reza; Royo Royo, Santiago (2016-06-29)
      Article
      Open Access
      Microcantilever motion detection is a useful tool for the characterization of the physical, chemical and biological properties of materials. In the past, different approaches have been proposed and tested to enhance the ...

    • Nanocharacterization techniques for investigating the durability of wood coatings 

      Vlad Cristea, Mirela; Riedl, Bernard; Blanchet, Pierre; Jiménez Piqué, Emilio (2012-03)
      Article
      Restricted access - publisher's policy
      Nanocharacterization techniques such as nanoindentation and atomic force microscopy were used to investigate the exterior durability of waterborne coatings improved with inorganic nanosized UV-absorbers. Nanocomposite ...

    • Periodicity in bimodal atomic force microscopy 

      Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
      Article
      Open Access
      Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ...

    • Phase contrast and operation regimes in multifrequency atomic force microscopy 

      Santos Hernández, Sergio (2014-04-07)
      Article
      Open Access
      In amplitude modulation atomic force microscopy the attractive and the repulsive force regimes induce phase shifts above and below 90°, respectively. In the more recent multifrequency approach, however, multiple operation ...

    • Quantification of dissipation and deformation in ambient atomic force microscopy 

      Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
      Article
      Restricted access - publisher's policy
      A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ...

    • Single cycle and transient force measurements in dynamic atomic force microscopy 

      Gadelrab, Karim Raafat; Santos, Sergio; Font Teixidó, Josep; Chiesa, Matteo (2013-11-21)
      Article
      Open Access
      The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments ...

    • Spatial horizons in amplitude and frequency modulation atomic force microscopy 

      Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
      Article
      Open Access
      In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ...

    • Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H. (2013)
      Article
      Open Access
      A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 ...

    • Study of the friction, adhesion and mechanical properties of single crystals, ceramics and ceramic coatings by AFM 

      Roa Rovira, Joan Josep; Oncins, Gerard; Díaz, Jordi; Capdevila, X.G.; Sanz Carrasco, Fausto; Segarra, M. (Elsevier, 2011-04-06)
      Article
      Restricted access - publisher's policy
      This paper reviews commonly used methods of analyzing and interpreting friction, adhesion and nanoindentation with an AFM tip test data, with a particular emphasis of the testing of single crystals, metals, ceramics and ...

    • Subharmonic excitation in amplitude modulation atomic force microscopy in the presence of adsorbed water layers 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Verdaguer, Albert; Chiesa, Matteo (American Institute of Physics (AIP), 2011-12-02)
      Article
      Open Access
      In ambient conditions, nanometric water layers form on hydrophilicsurfaces covering them and significantly changing their properties and characteristics. Here we report the excitation of subharmonics in amplitude modulation ...

    • Super-collimation by axisymmetric diffractive metamirror 

      Gailevicius, Darius; Grineviciute, Lina; Peckus, Martynas; Staliunas, Kestutis; Taranenko, Victor (2021-08-05)
      Article
      Restricted access - publisher's policy
      We propose and demonstrate experimentally super-collimation of light beams by an axisymmetric diffractive metamirror—an axisymmetric concentric dielectric ring structure positioned in front of a mirror at a distance of ...

    • The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Font Teixidó, Josep; Thomson, Neil H. (2011)
      Article
      Open Access

    • The Mendeleev-Meyer force project 

      Santos Hernández, Sergio; Lai, Chia-Yun; Amadei, Carlo Alberto; Gadelrab, Karim Raafat; Tang, Tzu-Chieh; Verdaguer Prats, Albert; Barcons Xixons, Víctor; Font Teixidó, Josep; Colchero, Jaimer; Chiesa, Matteo (2016-10-28)
      Article
      Open Access
      Here we present the Mendeleev–Meyer Force Project which aims at tabulating all materials and substances in a fashion similar to the periodic table. The goal is to group and tabulate substances using nanoscale force footprints ...

    • Towards atomic force microscopy measurements using differential self-mixing interferometry 

      Azcona Guerrero, Francisco Javier; Royo Royo, Santiago; Jha, Ajit (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Conference lecture
      Restricted access - publisher's policy
      In this paper, we explore the possibility of joining two measurement techniques that share a similar time frame and that are interested in describing the properties of materials through the study of the micro and ...

    • Unlocking higher harmonics in atomic force microscopy with gentle interactions 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Verdaguer Prats, Albert (2014-03-11)
      Article
      Open Access
      In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, ...

    • Wearing a single DNA molecule with an AFM tip 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2015-06)
      Research report
      Open Access
      While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is ...