Now showing items 21-40 of 44

  • Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC 

    Altet Sanahujes, Josep; González Jiménez, José Luis; Gómez Salinas, Dídac; Perpiñà, Xavier; Grauby, Stephane; Dufis, Cédric Yvan; Vellvehi, Miquel; Mateo Peña, Diego; Dilhaire, Stefan; Jordà, Xavier (2012)
    Conference report
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    This paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the ch aracteristics of temperature sensors embedded in a integrated circuit ...
  • Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers 

    Altet Sanahujes, Josep; González, José Luis; Gómez Salinas, Dídac; Perpiñà Gilabet, Xavier; Claeys, Wilfrid; Grauby, Stéphane; Dufis, Cédric Yvan; Vellvehi, Miquel; Mateo Peña, Diego; Reverter Cubarsí, Ferran; Dilhaire, Stefan; Jordà, Xavier (2014-05)
    Article
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    This paper reports on the design solutions and the different measurements we have done in order to characterize the thermal coupling and the performance of differential temperature sensors embedded in an integrated circuit ...
  • Electro-thermal coupling analysis methodology for RF circuits 

    Gómez Salinas, Didac; Dufis, Cédric Yvan; Altet Sanahujes, Josep; Mateo Peña, Diego; González Jiménez, José Luis (2012-09)
    Article
    Restricted access - publisher's policy
    In this paper an electro-thermal co-simulation methodology suitable for RF circuits is presented. It circumvents traditional transient simulation drawbacks that arise when signals or magnitudes whose frequencies are separated ...
  • Electro-thermal coupling analysis methodology for RF circuits 

    Gómez Salinas, Dídac; Mateo Peña, Diego; Altet Sanahujes, Josep (IEEE Computer Society Publications, 2010)
    Conference report
    Open Access
    In this paper we present an electro-thermal coupling simulation technique for RF circuits. The proposed methodology takes advantage of well established tools for frequency translating circuits in order to significantly ...
  • Examen Final 

    Vidal López, Eva María; Mateo Peña, Diego (Universitat Politècnica de Catalunya, 2014-01-08)
    Exam
    Restricted access to the UPC academic community
  • Exemple de disseny d’un sistema seqüencial: ampliació de la pràctica 2. 

    Altet Sanahujes, Josep; Mateo Peña, Diego; Pons Nin, Joan (Departament d'Enginyeria Electrònica, 2017-12-12)
    Audiovisual
    Open Access
  • Fast time-to-market with via-configurable transistor array regular fabric: A delay-locked loop design case study 

    González Colás, Antonio María; Pons Solé, Marc; Barajas Ojeda, Enrique; Mateo Peña, Diego; López González, Juan Miguel; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Abella Ferrer, Jaume; Vera Rivera, Francisco Javier (IEEE Computer Society Publications, 2011)
    Conference lecture
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    Time-to-market is a critical issue for nowadays integrated circuits manufacturers. In this paper the Via-Configurable Transistor Array regular layout fabric (VCTA), which aims to minimize the time-to-market and its associated ...
  • High level spectral-based análisis of power concumption in DSP's systems 

    Calomarde Palomino, Antonio; Mateo Peña, Diego; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2006)
    Conference report
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    In this paper, an efficient technique to evaluate temporal correlation and transition activity at high level in DSP systems is presented. The method is based on the spectral distribution of signals and has the advantage ...
  • Inductor shielding strategies to protect mmW LC-VCOs from high frequency substrate noise 

    Molina García, Marc; Aragonès Cervera, Xavier; Mateo Peña, Diego; González Jiménez, José Luis (2013-05-01)
    Article
    Restricted access - publisher's policy
    This paper analyzes the impact of high-frequency substrate noise on two 60 GHz LC-VCOs that implement different strategies for inductor shielding, namely floating and grounded shields. An analytical model, which has ...
  • MOSFET degradation dependence on input signal power in a RF power amplifier 

    Crespo Yepes, Albert; Barajas Ojeda, Enrique; Martin Martínez, Javier; Mateo Peña, Diego; Aragonès Cervera, Xavier; Rodríguez Martínez, Rosana; Nafría Maqueda, Montserrat (2017-06-25)
    Article
    Open Access
    Aging produced by RF stress is experimentally analyzed on a RF CMOS power amplifier (PA), as a function of the stress power level. The selected circuit topology allows observing individual NMOS and PMOS transistors ...
  • Non-invasive Monitoring of CMOS Power Amplifiers Operating at RF and mmW Frequencies using an On-chip Thermal Sensor 

    González Jiménez, José Luis; Martineau, Baudouin; Mateo Peña, Diego; Altet Sanahujes, Josep (IEEE Press. Institute of Electrical and Electronics Engineers, 2011)
    Conference report
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    In this paper a non-invasive, contact-less technique for the on-chip observation of PA operation is presented. It uses a differential temperature sensor that transduces the temperature increase due to the power dissipated ...
  • Non-invasive RF built-in testing using on-chip temperature sensors 

    Aldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (IEEE Computer Society Publications, 2009-11)
    Other
    Open Access
    This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
  • On evaluating temperature as observable for CMOS technology variability 

    Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
    Conference report
    Open Access
    The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ...
  • On line monitoring of RF power amplifiers with embedded temperature sensors 

    Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac (IEEE, 2012)
    Conference report
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    In the present paper we analyze that DC temperature measurements of the silicon surface can be used to monitor the high frequency status and performances of class A RF Power Amplifiers. As a proof of concept, we present ...
  • On the use of static temperature measurements as process variation observable 

    Gómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego (2012-10)
    Article
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    In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, ...
  • Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling 

    Méndez, M A; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (IEEE, 2005)
    Conference report
    Open Access
    The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the ...
  • Providing an UWB-IR BAN wireless communications network and its application to design a low power transceiver in CMOS technology 

    Barajas Ojeda, Enrique; Mateo Peña, Diego; González Jiménez, José Luis (Universitat Politècnica de Catalunya, 2010)
    Conference report
    Open Access
    Ultra Wide-Band (UWB) communication techniques have received increasing attention since United States Federal Communications Commission (FCC) adopted a “First Report and Order” in 2002. Unfortunately the regulations that ...
  • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

    Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
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    This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...
  • Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements 

    Aldrete Vidrio, Eduardo; Mateo Peña, Diego; Altet Sanahujes, Josep; Amine Salhi, M.; Grauby, Stéphane; Dilhaire, Stefan; Onabajo, M.; Silva-Martínez, José (2010-06-08)
    Article
    Open Access
    This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and ...
  • Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations 

    Onabajo, M.; Gómez Salinas, Dídac; Aldrete Vidrio, Eduardo; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (2011-06)
    Article
    Restricted access - publisher's policy
    Built-in test and on-chip calibration features are becoming essential for reliable wireless connectivity of next generation devices suffering from increasing process variations in CMOS technologies. This paper contains ...