Now showing items 21-29 of 29

  • Noise generation and coupling mechanisms in deep-submicron IC's 

    Aragonès Cervera, Xavier; González Jiménez, José Luis; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2002-09)
    Article
    Open Access
    On-chip noise generation and coupling is an important issue in deep-submicron technologies. Advanced IC technology faces new challenges to ensure function and performance integrity. Selecting adequate test techniques ...
  • On evaluating temperature as observable for CMOS technology variability 

    Altet Sanahujes, Josep; Gómez Salinas, Dídac; Dufis, Cédric Yvan; González Jiménez, José Luis; Mateo Peña, Diego; Aragonès Cervera, Xavier; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2010-05-26)
    Conference report
    Open Access
    The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures ...
  • Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling 

    Méndez, M A; Mateo Peña, Diego; Aragonès Cervera, Xavier; González Jiménez, José Luis (IEEE, 2005)
    Conference report
    Open Access
    The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the ...
  • Prediction of the impact of substrate coupled switching noise on frequency synthesizers 

    Osorio Tamayo, Juan Felipe; Aragonès Cervera, Xavier (2012-03-01)
    Article
    Restricted access - publisher's policy
    This paper proposes a methodology to accurately predict the phase noise effects in frequency synthesizers as a consequence of switching noise coupled through the substrate. The method proposed is based on a phase model of ...
  • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

    Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
    Restricted access - publisher's policy
    This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...
  • Set-up of Assura RCX-HF tools for the AMS S35 process. Configuration files and usage guide. 

    Aragonès Cervera, Xavier (2008-10-31)
    External research report
    Open Access
  • Temperature as observable magnitude in silicon integrated circuits to characterize high frequency analog circuits 

    Mateo Peña, Diego; Altet Sanahujes, Josep; Gómez Salinas, Dídac; Aragonès Cervera, Xavier (2013)
    Conference report
    Restricted access - publisher's policy
    This paper introduces a novel on-chip measurement technique for the determination of the central frequency and 3dB bandwidth of a 60GHz power amplifier (PA) by performing low frequency temperature measurements in silicon ...
  • Temperature sensors and measurements to test analogue circuits: questions and answers 

    Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
    Conference report
    Restricted access - publisher's policy
    We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ...
  • Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers 

    Altet Sanahujes, Josep; Mateo Peña, Diego; Gómez Salinas, Dídac; González Jiménez, José Luis; Martineau, B.; Siligaris, Alexandre; Aragonès Cervera, Xavier (2014-04)
    Article
    Restricted access - publisher's policy
    This letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The ...