Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras, Joan (2015-09-24)
Open AccessIntragate open defects are responsible for a significant percentage of defects in present technologies. A majority of these defects causes the logic gate to become stuck open, and this is why they are traditionally modeled ...
Weiner, Michael; Manich Bou, Salvador; Arumi Delgado, Daniel (2016-11-15)
Arumi Delgado, Daniel; Gómez Pau, Álvaro; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bargalló, Mireia; Campabadal, Francesca (2018-12-12)
Open AccessIn this letter a cell with the parallel combination of two TiN/Ti/HfO2/W resistive random access memory (RRAM) devices is studied for the generation of unpredictable bits. Measurements confirm that a simultaneous parallel ...