Now showing items 21-23 of 23

    • Test escapes of stuck-open faults caused by parasitic capacitances and leakage currents 

      Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras, Joan (2015-09-24)
      Article
      Open Access
      Intragate open defects are responsible for a significant percentage of defects in present technologies. A majority of these defects causes the logic gate to become stuck open, and this is why they are traditionally modeled ...
    • The SALVADOR simulation framework 

      Weiner, Michael; Manich Bou, Salvador; Arumi Delgado, Daniel (2016-11-15)
      Conference report
      Open Access
    • Unpredictable bits generation based on RRAM parallel configuration 

      Arumi Delgado, Daniel; Gómez Pau, Álvaro; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bargalló, Mireia; Campabadal, Francesca (2018-12-12)
      Article
      Open Access
      In this letter a cell with the parallel combination of two TiN/Ti/HfO2/W resistive random access memory (RRAM) devices is studied for the generation of unpredictable bits. Measurements confirm that a simultaneous parallel ...