Now showing items 1-5 of 5

  • A case for acoustic wave detectors for soft-errors 

    Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (2016-01-01)
    Article
    Restricted access - publisher's policy
    The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors. New techniques ...
  • Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery 

    Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
    Open Access
    The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling ...
  • Framework for economical error recovery in embedded cores 

    Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Conference report
    Restricted access - publisher's policy
    The vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and ...
  • Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery 

    Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Computer Society Publications, 2013)
    Conference report
    Restricted access - publisher's policy
    Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The exponential increase in the transistor count will drive the per chip fault rate sky high. New techniques for detecting ...
  • Setting an error detection infrastructure with low cost acoustics wave detectors 

    Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE, 2012)
    Conference report
    Restricted access - publisher's policy
    The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena making soft errors an important challenge in future chip multiprocessors (CMPs). Hence, ...