Exploració per autor "Upasani, Gaurang"
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A case for acoustic wave detectors for soft-errors
Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (2016-01-01)
Article
Accés restringit per política de l'editorialThe continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors. New techniques ... -
Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery
Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
Text en actes de congrés
Accés obertThe trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling ... -
Framework for economical error recovery in embedded cores
Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
Text en actes de congrés
Accés restringit per política de l'editorialThe vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and ... -
Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery
Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Computer Society Publications, 2013)
Text en actes de congrés
Accés restringit per política de l'editorialCosmic radiation induced soft errors have emerged as a key challenge in computer system design. The exponential increase in the transistor count will drive the per chip fault rate sky high. New techniques for detecting ... -
Setting an error detection infrastructure with low cost acoustics wave detectors
Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE, 2012)
Text en actes de congrés
Accés restringit per política de l'editorialThe continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena making soft errors an important challenge in future chip multiprocessors (CMPs). Hence, ...