Exploració per autor "Gaillard, Yves"
Ara es mostren els items 1-4 de 4
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Extraction of microstructural parameters from sculptured thin films nanoindentation
Gaillard, Yves; Jiménez Piqué, Emilio; Oliva Ramírez, Manuel; Jiménez Rico, Manuel; Gonzalez Elipe, Agustin R. (Elsevier, 2021-11-15)
Article
Accés obertThis work deals with the indentation analysis of nanocolumnar thin films and the difficulties encountered to deduce relevant mechanical parameters by this methodology. SiO2 thin films prepared by physical vapour oblique ... -
Nanoindetation of Yttria doped zirconia: effect of crystallographic structure on deformation mechanisms
Gaillard, Yves; Anglada Gomila, Marcos Juan; Jiménez Piqué, Emilio (2009)
Article
Accés restringit per política de l'editorialThis article presents a nanoindentation study of polycrystalline and single crystals of yttria-doped zirconia with both tetragonal and cubic phases. Analysis of the deformation mechanisms is performed by both atomic force ... -
Nitruración de 3Y-TZP para evitar la degradación hidrotérmica
Valle Chiro, Jorge Antonio; Jiménez Piqué, Emilio; Gaillard, Yves; Anglada Gomila, Marcos Juan (2010)
Text en actes de congrés
Accés restringit per política de l'editorial -
Thermoelastic phase transformation in TiNi alloys under cyclic instrumented indentation
Arciniegas Angarita, Milena Patricia; Gaillard, Yves; Pena, J; Manero Planella, José María; Gil Mur, Francisco Javier (2009-10)
Article
Accés obert